Quantitative X-Ray Microanalysis with a Low Voltage Scanning Electron Microscope

Barriers to Quantitative Electron Probe X-Ray Microanalysis for Low Voltage Scanning Electron Microscopy

Low voltage x-ray microanalysis, defined as being performed with an incident beam energy ≤5 keV, can achieve spatial resolution, laterally and in depth, of 100 nm or less, depending on the exact selection of beam energy and the composition of the target. The shallow depth of beam penetration, with the consequent short path length for x-ray absorption, and the low overvoltage, the ratio of beam ...

X-ray microanalysis attachment for electron microscope.

X-ray Microanalysis of Cultured Cells in the Scanning Electron Microscope and in the Scanning Transmission Electron Microscope: a Comparison

X-ray microanalysis of cultured cells as “whole mounts” (i.e., not sectioned) is used frequently e.g., to study mechanisms of ion transport. Cells can be cultured either on solid substrates or on thin plastic films on grids. Cells cultured on solid substrates are analyzed in the scanning electron microscope at relatively low accelerating voltage, cells cultured on thin films can be analyzed in ...

Quantitative X-ray microanalysis of thin specimens in the transmission electron microscope; a review

In a thin specimen X-ray absorption and fluorescence can, to a first approximation, be ignored and the observed X-ray intensity ratios, Ia/Ie, can be converted into weight fraction ratios, CA/CB, by multiplying by a constant kaB; CA/C B = kAB I A/IB. kAB values can be calculated or determined experimentally. The major correction which may have to be made to the calculated weight fraction ratio ...

Quantitative phase imaging with a scanning transmission x-ray microscope.

We obtain quantitative phase reconstructions from differential phase contrast images obtained with a scanning transmission x-ray microscope and 2.5 keV x rays. The theoretical basis of the technique is presented along with measurements and their interpretation.